High-Precision Alignments for Dual-Layer Detectors Based on a Slant-Edge Phantom

Dual-layer detectors can provide spectral x-ray images for organ classification and improved detection quantum efficiency. In this paper, we propose an alignment method for the dual-layer detector based on the slant-edge phantom that is used to measure the frequency response. The proposed method considers the notion of maximizing the frequency response of the convex combination of the upper and lower images. We show that the proposed method can provide better alignment accuracies than the traditional method case for the alignment problem of the dual-layer detector.