Impact of Particle Collision Effects and Maxwellian Injection on the Performance of Vacuum Diodes

This study investigates the distribution changes of various physical quantities in vacuum diodes under Maxwellian electron injection conditions, incorporating particle collision effects. By adapting a one-dimensional Particle-In-Cell (PIC) simulation to include particle collisions, we analyze the distribution of potential, electric field intensity, charge density, particle velocity, and the time evolution of spatial average current density across different electron mobilities. Comparative analysis with direct current (DC) bias and uniform velocity injection conditions further elucidates the impact of particle collisions on diode properties. Our findings suggest that tuning electron mobility can enhance vacuum diode performance, offering new insights for the advancement of terahertz technology.