Noise performance of 89Xnm single-mode VCSELs

The study of the noise characteristics of the 89X nm single-mode polarization-stable VCSELs based on InGaAs quantum wells is presented. When VCSEL emission is in resonance with the Cs D1 line, the relative intensity noise (RIN) is -105 dB/Hz at 1 Hz and -155 dB/Hz at 100 kHz. The polarization-resolved RIN is slightly higher than RIN but exhibits similar frequency behavior. The frequency noise is ~10
¹³
/f Hz
²
/Hz in the 1 Hz < f < 100 kHz range, which corresponds to the emission linewidth of ~30 MHz.