EMC Near-field Scanning System with Fast Scanning Method

With the rapid development of integrated circuits, electromagnetic interference has become a serious problem in the design of electronic equipment. Near-field scanning technology can analyze and diagnose radiation sources or noise propagation paths in high-speed circuits in real-time, without the need to identify the internal structural details of the device under test. The near-field scanning system designed in this paper can achieve a scanning range of 600mm×600mm×300mm, with a scanning accuracy of 0.05mm. Additionally, traditional nearfield sampling often uses uniform sampling, which would increase the sampling time cost. By using effective fast scanning method to reduce the number of sampling points, the designed near-field scanning system can increase sampling efficiency by more than 17% compared to traditional uniform sampling.