Fast Electromigration Stress Evolution Analysis Based on Relative Gain Array

As technology moves to smaller feature sizes and interconnect current densities continue to increase, electro migration (EM) poses a significant challenge to the reliability of the large integrated circuit design. In order to improve the efficiency of the EM stress analysis for any general interconnect or power grid, we introduce an efficient electro migration analysis approach based on decentralized model order reduction (MOR). Initially, the original Multi-Input Multi-Output (MIMO) system obtained by discretization is decoupled into a series of Multi-Input Single-Output (MISO) subsystems through the application of the Relative Gain Array (RGA) matrix. Subsequently, each subsystem is reduced by MOR techniques, thereby obtaining the reduced low-order subsystem corresponding to the certain output port for EM stress evolution analysis. By conducting simulations and numerical calculations on the resulting subsystem, the calculation efficiency can be greatly accelerated while maintaining the accuracy of EM transient analysis. Experiments demonstrate about 11X-187X speedup over COMSOL and about 11X-32X speedup over the standard transient analysis of original system, while the error is almost negligible.