VANDOR: Mitigating SEUs into Quantized Neural Networks

Embedded neural networks are increasingly deployed in critical applications, such as avionics and autonomous vehicle control. However, their reliability is challenged by various sources of soft errors, including radiation-induced faults from cosmic ray strikes, leading to Single Event Upsets (SEUs). To ensure the reliability of such systems, we present a novel hardware-based fault protection strategy tailored for embedded neural networks. The idea is based on mitigating faults by adapting at run-time any erroneous values (parameters, intermediate data) due to SEU towards zero upon fault detection. As neural networks exhibit heterogeneous sensitivity to fault direction, our hardware-based approach triplicates the sign bit (TMR) and uses a Voter block based on logical AND/OR gates to handle fault directionality. Through a comprehensive and exhaustive fault injection study, conducted on a Convolutional Neural Network (CNN) model, implemented on FPGA using fixed-point quantization, we show that our method is applicable to various hardware architectures while optimizing hardware cost, a crucial aspect in the context of embedded systems. Obtained results show that VANDOR protection efficiency is near ${9 0 . 9 7 \%}$ for the LeNet-5 CNN inference model, suitable for an embedded system. Additionally, it significantly reduces area overhead compared to existing approaches.