Evaluation of Data Acquisition Systems for Dielectric Frequency Response Measurements

This research focuses on evaluating data acquisition (DAQ) systems for Dielectric Frequency Response (DFR) measurements with the aim of determining the most suitable system for precise dielectric characterization. The performance of a 24-bit simultaneous sampling DAQ card and a 16-bit multiplexing DAQ card is compared with a commercial DFR instrument focusing on critical factors such as resolution, sampling frequency, sampling method, and the potential impact of error compensation. The cards are utilized in an experimental setup capable of performing low-voltage DFR measurements with an accuracy comparable to the commercial instrument. A low-loss ceramic capacitor is used as a test object. The results show that the 24-bit simultaneous sampling card has superior performance aligning well with the commercial DFR instrument.