Modular Platform for Automated Characterisation of Printed Structures, Devices and Circuits

We present a real-time-controlled platform applied for automated characterisation of structures, devices and circuits printed on planar substrates. Its modular setup allows for implementation of different probe heads and a large number of instruments for electrical testing. Microscope optics are used to capture high-resolution images of entire printed substrates. Based on these images printed structures on the substrates are optically inspected for printing errors by means of image processing and electrically tested. Applications include fast identification of optimal printing parameters for various ink-substrate combinations, characterisation of complex printed devices and circuits and identification of known-good structures for multi-stage printing.