An Investigation on Classical Methods and Unsupervised Deep Learning Algorithms for Image Segmentation in High Variance Images for Industrial Application

This paper investigates classical image processing techniques and unsupervised deep learning algorithms for segmenting images with high variance for an under researched industrial problem, focusing on beam burns generated by Focused Ion Beam (FIB) technology. Classical methods (CM) include preprocessing techniques such as edge detection, while Deep Learning (DL) employs Convolutional Neural Networks (CNNs) for unsupervised image segmentation. Experimental results demonstrate the superior accuracy of DL, but with increased computational overhead, in contrast to the efficiency and controllability of CM. Combining both approaches offers a potential solution for optimizing accuracy and efficiency in image segmentation.