Noniterative and Stable Permittivity Extraction of Solid Dielectrics Using a New Formalism Based on Frequency-Domain and Time-Domain Analyses

A noniterative and stable microwave non-resonant method is devised for accurate permittivity
$\varepsilon _{r}$
extraction of solid samples without the need for information of reference plane and sample thickness
$L $
. The method first evaluates reference plane transformation distances
$L_{01}$
and
$L_{02}$
and then calculates L using the location of first peaks (but not their values) of the magnitudes of forward and backward reflection scattering (S-) parameters in the time domain. Then, this information is used for noniterative and stable determination of
$\varepsilon _{r}$
in the frequency domain. Accuracy and uncertainty analyses are performed to examine the performance of the method. Permittivities of acrylonitrile butadiene styrene and polyethylene dielectric samples were measured by coaxial line (30 kHz–26.5 GHz) and free-space (8.2–12.4 GHz) measurements.