Self-Feedback Test Vector Generation Based on Weighted Matching Method

In integrated circuits, even minor errors can lead to significant consequences, highlighting the importance of circuit testing. The generation of test vectors throughout the entire built-in-self-test process is a crucial step. Self-feedback testing technology is an inherent self-testing technique where the circuit under test applies its own test vectors, leveraging the circuit itself as a resource. However, a challenge with this testing technique is the vast number of feedback schemes. Selecting suitable feedback schemes with higher fault coverage rates is a problem that needs to be addressed. This paper addresses the issue of feedback scheme selection in self-feedback testing technology by proposing a weight matching method. It calculates the weights of the original input ports and internal nodes of the circuit under test, selects the internal nodes that best match the original input ports based on weight matching, and determines the feedback scheme for the circuit under test. Additionally, improvements are made to the structure of the self-feedback circuit. Experimental data demonstrate that using the weight matching method and testing structure reduces the hardware overhead of the circuit by minimizing the number of selectors while ensuring sufficient fault coverage.