EMC Modeling of a Class-D Amplifier IC and Radiated Emission Correlation Studies for its Evaluation Board

This paper presents the Radiated Emission (RE) correlation studies between the Electromagnetic Interference and Electromagnetic Compatibility (EMI/EMC) simulations and the corresponding chamber measurements for a Class-D amplifier IC. The primary aim of this paper is to analyze a device’s EMI/EMC performance and devise strategies to mitigate electromagnetic noise early in the design phase by simulations. Towards that objective, models are also developed to represent the noise behavior of Class-D amplifier IC, and the same are used in RE simulations to establish correlation with the measured data. Several iterative studies are presented to showcase the usefulness of simulations in predicting the failure region, early in the design phase for a Class D amplifier IC evaluation board with a switching frequency of 2 MHz.