Analysis of Electrical Stress of Switched-Mode Power Supply (SMPS) on Conductive Electromagnetic Pulses

In this paper, conductive stress analysis was conducted through electronic switched-mode power supply (SMPS) circuit modeling and experiments. When electronic devices are exposed to unintended electromagnetic pulses, problems may occur in the operation of SMPS. To protect devices from threatening problems such as conductive electromagnetic pulse (EMP), it is necessary to analyze damage mechanisms caused by electrical stress during electronic device operation. Therefore, in this paper, we manufactured a circuit board that simulates the SMPS of electronic devices and analyzed the effect on electric fast transient (EFT) through experiments and simulations. As a result of the analysis, the noise is mainly attenuated through the input filter, and the input rectifier diodes may break down after the filter burns out, resulting in a breakdown of the power supply. The results of this research can be used as preliminary research on evaluating the impact of SMPS on electronic devices caused by high-power electromagnetic waves such as EMP, surge, and intentional electromagnetic interference (IEMI).