Outage Probability Analysis of RIS-Assisted System over Weibull/Rayleigh Fading Channels

In upcoming communication systems, particularly beyond fifth-generation (B5G) and sixth-generation (6G), reconfigurable intelligent surfaces (RIS) are anticipated to offer significant advancements. This study analyzes the outage probability of an RIS-aided communication system under Weibull and Rayleigh fading conditions. The proposed system model assumes Weibull fading for the channel between the source and RIS, while Rayleigh fading is assumed for the channel between RIS and destination. Numerical simulations are conducted across various configurations to assess the impact of different fading parameters, reflective surface elements, signal-to-noise ratio (SNR), and instantaneous SNR threshold values. Comparative analysis between the results obtained from the derived expression and exact results is presented. Notably, the analytical and simulation results exhibit strong consistency, indicating the robustness of the proposed approach.