Near Field Electromagnetic Interference Coupling-Mechanisms of Multilayer Ceramic Capacitors

In this work, the electromagnetic coupling of a multilayer ceramic capacitor (MLCC) to a closed transversal electromagnetic waveguide, used for standardized metrological characterization procedures in the field of electromagnetic compatibility, is investigated. The different coupling paths between the finger electrodes of the device under test (DUT) and the measurement device are characterized by numerical field simulations and measurements. The information gained makes it possible to distinguish between the two asymmetrical DUT electrodes that are not visible or distinguishable from the outside.