Automated Defect Detection in Electronic Components using Convolutional Neural Networks

This exploration paper explores the operation of convolutional neural networks(CNNs) in automating the discovery of blights in electronic factors. With the rapid-fire advancement of technology, the demand for high- quality electronic factors has surged, emphasizing the need for effective disfigurement discovery styles. using the capabilities of CNNs, this study aims to develop a robust and accurate automated system able to relate colorful types of blights to electronic factors. By training the CNN model on a different dataset of disfigurement images, the system learns to fete subtle variations and anomalies reflective of faults, thereby enhancing examination delicacy and effectiveness. The proposed approach offers promising results in streamlining disfigurement discovery processes, reducing homemade intervention, and ameliorating overall quality control in electronics manufacturing. Results indicate the effectiveness and trustability of CNNs in automating disfigurement discovery, paving the way for enhanced productivity and product trustability in electronic diligence.