Faulty Function Extraction for Defective Circuits

It is well-known that understanding the behavior of silicon failures is an essential step in yield learning. It is also becoming more important for producing high-quality silicon due to the increasing number of defects detected fortuitously. In order to meet this need, a new approach for extracting the precise faulty function from defective logic circuits is described. The approach is applied to nearly a 1,000 14nm failures and one use case of the results on improving ATPG is discussed.