A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement

This paper introduces a concept of provably detected defects that are identified through topology analysis and AMS verification database inquiry. The main purpose is to associate detected status to such defect without simulation, thereby reducing the size of defect simulation campaign. The proposed approach is a combination of fundamental and empirical rule-based set targeting relevant steps that are part of regular design sign-off. The feasibility is illustrated on an industrial product that is currently undergoing final stages of the tape-out, with the results complying to the current status of upcoming IEEE P2427 standard in development.