Research on the identification method of travelling wave reflection signal aliasing for IGBT fault feature extraction

The Insulated Gate Bipolar Transistor (IGBT) is a pivotal component in power electronic circuits, and monitoring its status can significantly enhance the reliability of power systems. This paper introduces the application of the STDR/SSTDR method in the realm of IGBT status recognition and fault diagnosis. Furthermore, a fault identification algorithm capable of discerning overlapping waves is proposed for status recognition and fault diagnosis of power semiconductor devices. Experimental validation attests to the method's effectiveness in accurately identifying the operational status of IGBTs and detecting open-circuit and short-circuit faults.