A Methodology to Estimate On-Voltage Degradation of Power Devices According to a Power Cycling Mission Profile

This work introduces a methodology to generate on-voltage degradation curves, representative of power devices subjected to generic power cycling profiles. While constant stress conditions are commonly used to train data-driven lifetime models of power devices, this paper presents a methodology allowing to predict on-voltage degradation curves in realistic power cycling scenarios without requiring extensive tests under non-constant stress. The approach combines experimental tests under constant stress conditions carried out on TO-247 IGBT devices. The predicted on-voltage degradation profiles are compared with experimental data to prove the accuracy of the method.