Evaluation Method of Residual Life of Extended Stored Electronic Components Based on Electrical Parameter Degradation

Electronic components will have parameter drift and material degradation after long-term storage, which may even affect system reliability. Nowadays, some components that have exceeded the storage life can be successfully applied after qualified reinspection, which plays an important role in saving resources and funds. In this paper, a remaining life evaluation method is presented based on the degradation of electrical parameters. Firstly, this paper focuses on three types of components: single-chip integrated circuits, discrete devices, and fuses that have exceeded their specified storage period. Based on the analysis of electrical parameter data, typical components are divided into two categories: electrical parameter degradation and non-degradation. Secondly, the storage failure mode and mechanism of different electrical components are analyzed according to the classification and combined with the experimentally observed device states with the investigated mechanisms. Finally, for whether electrical parameters are degraded, this paper supports the residual storage life of the components and assesses the application risk. The remaining life is estimated to be 8 years and 28 years more respectively by using the method in triode and fuse data cases. The method in this paper provides a reference for the appropriate storage of overextended storage components.