Simulation of X-band Transverse Deflection Structure with Variable Polarization

In order to character the three dimensional (3D) charge distribution of particles and the six dimensional (6D) phase space in beam measurements, we study the transverse deflection structures (TDS) with variable polarization. Transverse deflection structures (TDS) with variable polarization can change the orientation of the streaking field to an arbitrary azimuthal angel, which provide the possibility for extended beam characterization. In this paper, we have conducted preliminary research on several key components in the transverse deflection structures (TDS) with variable polarization, such as E-rotator and transverse deflection structure. The E-rotator can output TE11with different polarization angles by adjusting the rf phase difference between two input ports, and its reflection coefficient (S12,13 can be less than −50 dB. The transverse deflection structure supports TM110-like mode with arbitrary polarization angle and is a constant impedance structure, with a reflection coefficient (S11) less than −40 dB.