A Unified OTP and PUF Exploiting Post-Program Current on Standard CMOS Technology

Root-of-Trust (RoT) uses the hardware primitives to provide security in the integrated electronic systems, preventing attacks against the vital information of the system. The typical hardware primitives are used to generate random numbers and store the system's keys. However, the implementation of these primitives achieves challenges in the system due to the physical phenomena used to obtain the entropy for the random number. On the other hand, the non-volatile memories request special technologies with additional processes and layers. This work presents an implementation of a One-Time Program (OTP) memory using an Anti-Fuse (AF) methodology in 180nm standard CMOS technology. In addition, a Physical Unclonable Function (PUF) is unified, exploiting the post-program current generated in the OTP bit cell. A 128-bit OTP array and high-voltage driver are implemented without any special process and layer, occupying 68000μm
²
. On the other hand, the PUF implementation achieves 49.02% of uniformity, 49.52% of uniqueness, and 99.88% of reliability in the worst case with Process, Voltage, and Temperature (PVT) variations. In addition, the PUF reports a 2651F
²
/bit normalized area. The OTP memory application needs 6.7-V to program the AF bit cell.