Nano-Scale Rough Surface Imaging with THz-s-SNOM

Terahertz scattering-type scanning near-field optical microscopy (THz-s-SNOM), known for its high resolution, is widely used across fields. However, its application to sample shapes is underexplored. This study simulates rough surfaces, revealing the impact of surface roughness on scattered signals. Using a self-built THz-s-SNOM system, it images contaminated samples, aiding in determining surface contaminant nature. These findings enhance our understanding of sample morphology effects on THz-s-SNOM signals, showcasing its diverse applications. The study emphasizes the need for further exploration and technological advancements to improve practical utility.