PA-2SBF: Pattern-Adaptive Two-Stage Bloom Filter for Run-Time Memory Diagnostic Data Compression in Automotive SoCs

In the realm of safety-critical Automotive System-on-Chip (SoC) design, memory functionality plays a crucial role in determining overall die yield due to its sizable footprint on the chip. Therefore, efficient methodologies for both post-manufacturing offline testing and real-time monitoring are essential to provide timely diagnostic feedback. This paper proses a real-time memory diagnostic data compression technique Pattern-Adaptive Two-Stage Bloom Filter (PA-2SBF) for automotive System-on-Chip (SoC) applications. PA-2SBF is designed to address the challenge of false positives incorporating frequently encountered failure patterns. Bloom filters, a probabilistic data structure renowned for their space-efficiency and quick approximate membership queries, are employed to expedite fault memory diagnosis information lookup and compression. Furthermore, failure patterns are considered to mitigate the false positive rate inherent in Bloom filters. The paper also presents a strategy for leveraging the compressed diagnostic information during run-time. Specifically, it exploits the quick lookup feature of Bloom filter to prohibit CPU access to defective memory regions, enhancing overall system reliability.