Fast Estimation for Electromigration Nucleation Time Based on Random Activation Energy Model

Electromigration (EM) has attracted significant interest in recent years, because the current density of on-chip power delivery networks (PDNs) is always increasing. However, the EM phenomenon is affected by the randomness of the annealing process during nanofabrication, which requires more reliable statistical models for EM analysis. In this work, we propose a fast estimation method for EM nucleation time based on the random activation energy model. Experiments demonstrate that our method can accurately and efficiently analyze the nucleation time distribution under random processes, and achieve 39.1% improvement in estimation speed compared with the previous work.