High-Temperature Atomized Water–Assisted Reconstruction of CsPbBr₃ Wafers for High-Performance X-Ray Detection

In this letter, CsPbBr3 wafers are obtained through the pressure-induced aggregation of CsPbBr3 powder and further modified through a high-temperature atomized water (HTAW) treatment strategy for the first time. Such a strategy helps to the reconstruction of CsPbBr3 grains in the HTAW environment and thus the densification of the wafer surface. The as-fabricated wafers were used to develop X-ray detectors that exhibited a dark resistivity of
$2.43 \times 10^{{9}}~\Omega $
, sensitivity of
$143845.34~\mu $
C Gy
$_{\text {air}}^{-{1}}$
cm
$^{-{2}}$
at 20 V bias, and detection limit of 121.21 nGy s
$^{-{1}}$
, which are greatly improved than those of the pristine CsPbBr3 wafers and among the highest performance of reported CsPbBr3perovskite X-ray detectors. Our work provides a reliable strategy for optimizing finished perovskite wafers and enhancing the performance of X-ray detectors.