Characteristics of Accelerated Aging for Metal Foil Resistor Stabilization

As a high-precision device, metal foil resistors are key components in high-precision measurement equipment and standard equipment. The resistance drift caused by time and temperature variables will directly affect the accuracy of the equipment. To reduce the drift of metal foil resistors during work, this paper studies the feasibility of shortening the time for metal foil resistors to enter a stable period of resistance through high-temperature accelerated aging based on the aging trend of electronic components, and analyzes the effects of different resistor manufacturers, sealing forms, resistance values and aging temperatures on the accelerated aging results. Temperature shock experiment and temperature coefficient experiment are conducted on metal foil resistors that have entered a stable period after accelerated aging to verify the reliability of the aging scheme.