A Novel Q-Choked Resonator for Microwave Material Measurements Alleviating Sample Thickness Limitations of Existing Techniques

A novel concept of choked resonators is presented and applied for microwave testing of thick samples of high-permittivity materials. A new 10-GHz Q-choked split cavity resonator (Q-SCR) is designed, manufactured, and validated for a stack of sapphire samples, up to 2 mm thick. The measured values of dielectric constant and loss factor are in excellent agreement with reference data. The work is supported with full-wave electromagnetic (EM) modeling, which is now further used for designing millimeter-wave (mmWave) Q-SCRs.