Design and Test of a Time-to-Digital Converter ASIC Based on a Differential Delay Line

As one of the main components of a high-precision time measurement system, the time-to-digital converter (TDC) is widely used in many scientific research fields. A two-stage high-precision and wide-range TDC application-specified integrated circuit (ASIC) based on a differential delay line using delay-locked loop (DLL) technology is presented. The TDC ASIC consists of a coarse measurement stage for expanding the measurement range and a fine measurement stage for high-precision measurement. The coarse stage is achieved by two binary counters with dual edges sampling to avoid the metastable state. The fine stage is achieved by a voltage-controlled delay line (VCDL). The VCDL utilizes differential delay cells to mitigate the susceptibility to the power supply noise and the substrate noise. A DLL is adopted to compensate for variations in process, voltage, and temperature (PVT). The TDC AISC has been fabricated in a 180-nm CMOS technology and tested. A dynamic measurement range of
$6.55~\mu $
s and a time resolution of 200 ps are achieved with a reference clock of 312.5 MHz. Test results show that the precision is 65.6-ps root-mean-square (rms), and the differential nonlinearity is within -0.34–0.40 LSB.