Modified Bisection Thru-Only Deembedding Algorithm for Long Test Fixtures

Thru-only deembedding is a simple deembedding method using a single deembedding structure. Common thru-only deembedding methods often have overshoots in the deembedded S-parameters when the deembedding structure is $\frac{\lambda }{2}$ long. This is caused in the bisection step. A modified approach is presented, which extracts the phase of the S-parameters of the deembedding structure before the bisection step, performs the bisection on the magnitude of the S-parameters and applies the phase afterwards again, therefore eliminating the overshoots. The accuracy of the proposed algorithm is verified on measured test structures.