Experimental Investigation of EM Side Channel and FI Attacks on Commercial FRAM Chips

In this study, we experimentally investigate side channel attack (SCA) and fault injection (FI) vulnerabilities of commercial FRAM chips using differential electromagnetic analysis (DEMA). Through experimental monitoring and analysis of EM emanations, we demonstrate the possibility of decoding memory operations. Further, we experimentally demonstrate a case study of information extraction and data corruption via an EM Fault Injection attack.