Automated Control Setup for Measurement of Characteristics of Interferometer's Opto-Electronic Devices

In the article the principle of operation of single-frequency quadrature interferometers is stated, the basic equation of measurements is given and the main components of the error of increment measurement, which are affected by photodetector modules and analog adders, were found and also schemes of stands for control of their basic parameters are offered and methods of measurements are described. It is shown that the use of boards based on FPGA, ADC and DAC instead of classical signal generators and oscilloscopes allows to test optoelectronic devices with great economic efficiency without loss of accuracy.