Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems

With the development of the information society and the rapid rise of new generation information technology industries represented by smart earth, the internet of things, and cloud computing, the data transmission and processing capabilities has faced unprecedented challenges for the existing visual information perception methods, which limits the improvement of imaging system characteristics. The ultra high resolution CMOS image sensor microsystem is a groundbreaking product which leads the future development of the optoelectronic imaging field. This manuscript mainly focuses on the research ideas of Test Parameters for ultra high resolution CMOS image sensor microsystem. Moreover, the optoelectronic/spectral parameter testing and image quality parameter testing are similar with the traditional CMOS image sensor, and the new Test Parameters derived mainly include geometric parameter testing and complex scene multi object recognition testing according to the characteristics of the ultra high resolution CMOS image sensing microsystem. In addition, this manuscript proposes aspects that need to be improved based on new products in terms of testing methods for optoelectronic/spectral parameters and image quality parameters. A preliminary set of Test Parameters for new products has been established. Adopting targeted testing methods is an important part of subsequent performance evaluation of new products.