PXI-based measurement and analysis of 230-330 GHz terahertz vertical wall reflection channels

The emergence of terahertz technology defines the future of mobile communications, which has the potential to unleash the full capabilities of sixth generation networks, the key to which is the exploration of terahertz wireless channels as the basis for terahertz communications. In this paper, based on the introduction of the measurement method of reflection characteristics of indoor wireless channel, based on the vector signal transceiver platform PXI, the reflection measurements of vertical incidence angle, vertical reception of three materials, namely, stainless steel brushed, stainless steel unbrushed and white paper, in 230~330GHz frequency band in indoor environment are conducted, and the relationship between the reflection distance and the path loss is analysed. The experimental results show that the reflection loss shows a tendency of decreasing and then becoming larger as the distance increases, and the reflection loss is related to the roughness of the reflecting surface of the material. Finally, an outlook on the study of terahertz channel reflection characteristics is given.