A Robust And Cost-Effective Process Control Monitor Concept to Verify Quality Characteristics of Printed Circuit Boards up to 40 GHz

This paper presents a concept to examine the dielectric constant, dissipation factor, substrate height and etch quality of printed circuit boards. With a robust probe system, manual millimeter-wave measurements are possible within harsh environments. In combination with on-board sensors, material and processing tolerances can be determined easily with very low precision loss compared to established measurement methods.