Optimizing automated testing for high throughput

Throughput in automated testing is a critical issue, especially at the maintenance level. Some general rules and approaches, when used with an analysis of the total test requirement, can often substantially reduce test time. New programming environments and new (to test equipment) interface standards such as Ethernet, when available, may provide significant throughput improvement in a test system. Agilent's recent work with manufacturers in the wireless industry has helped validate a variety of approaches to optimize test throughput for transceiver manufacturing. We have found that very significant gains can be realized from only a modest investment. This paper describes successful practices and techniques for optimizing test throughput, and gives specific quantitative examples of the improvements that have been achieved.