QcAssert: Quantum Device Testing with Concurrent Assertions

Quantum devices are extremely noisy due to its inherent architecture. This can introduce errors or completely erase the information stored in qubits. High noise levels in a quantum device can lead to errors even when the quantum circuit is not buggy. Therefore, it is essential to verify that the noise level of the device is tolerable while running the quantum circuit. In this paper, we propose a quantum device testing framework using concurrent assertions. Specifically, we introduce a new type of assertion “QcAssert”, which has the ability to run concurrently with the quantum circuit to ensure that the quantum device is working as expected. We demonstrate the effectiveness of the QcAssert in dynamic device testing using a suite of popular quantum benchmarks, including Shor’s factoring algorithm and Grover’s search algorithm.