Low frequency noise measurements in LSMO/Nb:STO heterostructure

This study presents experimental results, including low-frequency noise measurement, for considering the La
2/3
Sr
1/3
MnO
3
/Nb:SrTiO
3
(0.05 wt%) heterostructure as a Schottky diode. The nearly optimal properties measured in reverse mode at low bias are likely related to the high crystalline quality of both the substrate and the epitaxial film grown by Pulsed Laser Deposition. Such results open the way for the development of high-performance devices, like photodiodes.