Automated Characterization in Cryocon 22C at Wide Temperature Range using LabVIEW

This paper presents the development of an algorithm using LabVIEW, a B2912B SMU, and a Model 22C Cryogenic temperature controller for automating the characterization of various semiconductor devices. The algorithm is carried out using LabVIEW. By removing human error and enhancing precision through temperature control, the research aims to streamline the measurement procedure. Users enter the desired temperature values into the LabVIEW program. The Cryocon 22C is then automatically turned on by the algorithm to use a PID control method to stabilize the temperature near the sample. Once the temperature has stabilized, the software performs automatic characterization of the sample, including Gummel plot and Gummel plot negative sweep. To accurately capture the temperature-dependent features of the sample, measurements are performed at various temperatures. The method has the potential to increase productivity in a variety of semiconductor characterization and research applications due to its success in achieving temperature stability and precise measurements.