Subthreshold Slope Variability and its Impact on Ultra-Low Power Circuit Design through Device-Circuit Simulations

When it comes to ultra-low power (ULP) circuit design, a transistor's subthreshold slope (SS) is a crucial factor in defining the device's operating speed and energy efficiency. This study explores in detail the subthreshold slope's unpredictability and how it affects ULP circuit design. We have conducted a thorough analysis of the inherent and extrinsic variables, such as temperature fluctuations, process changes, and defective materials, that contribute to SS variability using sophisticated device-circuit simulations. Our results demonstrate that small changes in SS may have a substantial impact on ULP circuit performance measures, highlighting the need of careful design techniques and reliable simulation models. Additionally, in order to mitigate the negative impacts of SS fluctuation and guarantee optimum performance in ULP circuits, we present unique mitigation approaches. In addition to expanding our knowledge of the complex interplay between device properties and circuit performance, our work opens the door for the creation of ULP electronic systems that are more durable and energy-efficient while dealing with SS unpredictability.