In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique

This work explores a combination of techniques using pulsed and continuous lasers to investigate and quantify the suitability of the state-of-the-art logic technology for radiation-hardened applications. We find that using a laser allows the sensitivity of underlying circuitry to be evaluated providing insight into the underlying failure mechanisms and enabling further hardening by design opportunities. Finally, we show a noninvasive pump-probe laser voltage probe (LVP) technique that allows us to evaluate logic circuitry response of various design topologies to ionizing radiation events.