Measurement of Dielectric Properties and Reflection Loss for Low-Loss Substrates and Conductors in Millimeter-Wave Ranges

In this paper, electromagnetic characterization techniques for dielectric substrates and conductors in millimeter-wave ranges are studied. A quasi-optical Fabry-Perot open resonator (FPOR) is developed to measure the complex permittivity of low-loss materials and the reflection loss of metal samples non-destructively at (20~67) GHz. The FPOR supports accurate measurements for both the electrically thin and thick samples owing to that the double-concave and the plano-concave operation mode can be switched easily in the same apparatus.