Dual-Projector Structured Light Illumination for 3D Measurement of Highly Reflective Surface

In structured light 3D measurement, highly reflective surfaces cause image saturation in captured camera images, which negatively impacts point cloud reconstruction. In this paper, we propose a dual-projector method as a solution to this problem. Firstly, by capturing images from two different projectors, the camera obtains two groups of information that can compensate each other. Second, the phase order is employed to determine the invalid phase, and subsequently categorize pixels based on the results. Finally, according to different pixel categories, the appropriate model is selected for point cloud reconstruction. The experiment results demonstrate that the proposed method effectively reduces the flying points in the point cloud derived from highly reflective surface and enhances the quality of the reconstructed point cloud.