Single Bit Upsets versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron - SECDED is No Longer Effective -

We measured soft errors on two 8Gb DRAMs by neutron irradiation. The results showed that the soft error rates for both DRAMs were about 3 FIT/Gb. An SBU that can be corrected by ECC were rarely measured, while burst errors caused by soft errors on peripheral circuits become dominant. Burst errors cannot be corrected by conventional ECC. Thus the SEC (Single Error Correction) mandatory in DDR5 cannot recover soft errors.