Design and Analysis of Latches Using RHBD Technology

This paper introduces a novel approach to achieving Outstanding efficiency and minimal power consumption through a Self-recovering double node upset (DNU) RHBD (Radiation Hardened by Design) latch. By establishing interlocking connections among all internal nodes, the latch demonstrates the capability to recover from DNUs occurring in any potential node pairings. Specifically, the correct inputs of both CE1 and CE3 ensure the self-recovery of N1 and N3 from DNUs, rendering the latch DNU -self-recoverable for this scenario. This self-recoverable property extends to cases where N2 or N4 are affected by DNUs as well. Consequently, the latch exhibits universal DNU self-recoverable characteristics across all critical node pairs. Upon the occurrence of a DNU in any of these pairs, the latches promptly restore functionality. Notably, these DNU self-recoverable latches offer a cost-effective solution for enhancing reliability while maintaining efficiency.