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Enhancing Open Circuit Switch Fault Localization in Two-Level Voltage Source Inverters through Machine Learning with 3D Current Trajectory Analysis | IEEE Conference Publication | IEEE Xplore

Enhancing Open Circuit Switch Fault Localization in Two-Level Voltage Source Inverters through Machine Learning with 3D Current Trajectory Analysis


Abstract:

This paper proposes an enhanced approach for localizing open circuit faults (OCFs) in two-level voltage source inverters (VSIs). OCFs in VSIs can lead to critical system ...Show More

Abstract:

This paper proposes an enhanced approach for localizing open circuit faults (OCFs) in two-level voltage source inverters (VSIs). OCFs in VSIs can lead to critical system failures which can also be catastrophic if not localized or attended to within a small time-frame. While detecting the OCFs is important, accurate localization of OCFs is paramount as it helps in reducing the downtime of the system. Leveraging machine learning algorithms, including a neural-based classifier called the Wide Neural Network (NN) and a non-neural classifier known as the Subspace KNN, the proposed study demonstrates promising results. The Wide NN achieves an accuracy of 97.16%, while the Subspace KNN achieves an impressive accuracy of 99.66% in fault localization. These high accuracies contribute to improved VSI reliability in various industrial applications, advancing the field of power electronics by exploring innovative fault detection and localization techniques.
Date of Conference: 03-06 December 2023
Date Added to IEEE Xplore: 02 February 2024
ISBN Information:
Conference Location: Wollongong, Australia

References

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