Research on Fast Simulation Method of Single Event Effect Based on Multi-point Injection Method

Aiming at the slow speed of single event effect simulation of large-scale integrated circuits, a fast simulation method based on multi-point fault injection is proposed in this paper. This method adopts a multi-point fault injection method to improve the efficiency of fault injection; at the same time, the mixture circuit model described by Verilog and SPICE improves the simulation speed while ensuring the simulation accuracy. The Leon2 system is simulated by this method, the simulation results show that the faults in the multi-point fault injection method don’t affect each other and are irrelevant; In the process of randomly injecting 20 faults, the time cost of the fast simulation method is only 27.3% of that of the traditional method, which greatly improves the simulation efficiency.