In-situ ellipsometric characterization of nucleation conditions of HgCdTe grown by MBE

We constructed an optical model to characterize with a spectroscopic ellipsometer (SE) the nucleation of Hg/sub 1-x/Cd/sub x/Te (MCT) grown by molecular beam epitaxy on CdZn/sub 0.035/Te (CZT) substrates. Substrates of 2/spl times/2cm/sup 2/ area were loaded into a RIBER 32P chamber and heat cleaned to remove oxide according to a standard procedure. SE spectra were recorded during the cleaning procedure and the entire growth process.