Analysis of the Damage Characteristics of Integrated Circuits with Various Pulse Width

This research aims to propose an effective and low-cost solution for Electromagnetic compatibility (EMC) of integrated circuits, and comprehensively understand the impact of electrostatic discharge (ESD) on integrated circuits. The transient IV curves of integrated circuits were compared and analyzed. The transient conduction damage of integrated circuits under different pulse widths was studied. The results indicate that the comparison of transient IV curves and the characteristics of transient conduction damage have certain regularity.